Characterization of crystal growth defects by X-ray methods
- Författare
- D. Keith Bowen Brian K. Tanner NATO advanced study institute on characterization of crystal growth defects by X-ray methods 1979) (Durham :
- (Ed. by Brian K. Tanner and D. Keith Bowen., Proceedings of the NATO advanced study institute on characterization of crystal growth defects by X-ray methods, held August 29-September 10, 1979, at Durham university, Durham, United Kingdom)
- Genre
- Konferenser, Ej skönlitteratur, Konferenspublikation
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Plenum P. | cop. 1980 | USA, New York | 589 sidor. diagr., ill., tab. |